Spectroscopy of single metallic nanoparticles using total internal reflection microscopy

Melville, NY / American Inst. of Physics (2000) [Journal Article]

Applied physics letters
Volume: 77
Issue: 19
Page(s): 2949-2951

Authors

Selected Authors

Sönnichsen, C.
Geier, S.
Hecker, N. E.
von Plessen, G.
Feldmann, J.

Other Authors

Ditlbacher, H.
Lamprecht, B.
Krenn, J. R.
Aussenegg, F. R.
Chan, V. Z.-H.
Spatz, J. P.
Möller, M.

Identifier