Study of structural properties of MOVPE grown ZnMgSSe layer by HRXRD and cathodoluminescence

Amsterdam [u.a.] ; Jena / Elsevier (1998) [Contribution to a conference proceedings, Journal Article]

Thin solid films
Volume: 319
Issue: 1/2
Page(s): 57-61

Authors

Selected Authors

Xu, J.
Liu, Q.
Kalisch, H.
Woitok, J.
Heuken, M.

Other Authors

Lakner, H.

Identifier