In situ measurements of thickness changes and mechanical stress upon gasochromic switching of thin MoOx films

Melville, NY / IOP Publ. (2004) [Journal Article]

Journal of applied physics
Volume: 95
Issue: 12
Page(s): 7632-7636

Authors

Selected Authors

Okumu, J.
Koerfer, F.
Salinga, Christian Lothar
Wuttig, Matthias

Identifier