Phase-change random access memory: A scalable technology

Armonk, NY / IBM (2008) [Journal Article]

IBM journal of research and development
Volume: 52
Issue: 4/5
Page(s): 465-479

Authors

Selected Authors

Raoux, S.
Burr, G. W.
Breitwisch, M. J.
Rettner, C. T.
Chen, Y.-C.

Other Authors

Shelby, R. M.
Salinga, Martin
Krebs, D.
Chen, S.-H.
Lung, H.-L.
Lam, C. H.

Identifier