Threshold field of phase change memory materials measured using phase change bridge devices

Melville, N.Y / American Institute of Physics (2009) [Journal Article]

Applied physics letters
Volume: 95
Issue: 8
Page(s): 082101

Authors

Selected Authors

Krebs, Daniel
Raoux, Simone
Rettner, Charles T.
Burr, Geoffrey W.
Salinga, Martin

Other Authors

Wuttig, Matthias

Identifier