Investigation of MOVPE-grown InGaAs/InP multi quantum wells by Raman spectroscopy and X-ray diffractometry

Lausanne / Elsevier Sequoia (1993) [Journal Article]

Materials science & engineering / B, Solid state materials for advanced technology
Volume: 21
Page(s): 161

Authors

Selected Authors

Finders, J.
Keuter, M.
Gnoth, D.
Geurts, J.
Woitok, J.

Other Authors

Kohl, A.
Möller, R.
Heime, K.

Identifier

  • REPORT NUMBER: RWTH-CONV-055825