Characterisation of porous silicon layers by spectroscopic ellipsometry

Amsterdam / North-Holland Publ. (1993) [Journal Article]

Journal of luminescence
Volume: 57
Page(s): 205

Authors

Selected Authors

Rossow, U.
Münder, H.
Thönissen, M.
Theiss, W.

Identifier

  • REPORT NUMBER: RWTH-CONV-055815