Infrared reflection studies of ceramics: Characterization of SiC layers on graphite substrates

Berlin [u.a.] / Springer (1993) [Journal Article]

Fresenius journal of analytical chemistry
Volume: 346
Page(s): 99-103

Authors

Selected Authors

Hopfe, V.
Grählert, W.
Brennfleck, K.
Korte, E. H.
Theiss, W.

Identifier

  • REPORT NUMBER: RWTH-CONV-055814