Chemical composition of porous silicon layers studied by IR spectroscopy

Amsterdam [u.a.] / Elsevier (1993) [Journal Article]

Applied surface science
Volume: 63
Page(s): 240-244

Authors

Selected Authors

Theiss, W.
Grosse, P.
Münder, H.
Lüth, H.
Herino, R.

Other Authors

Ligeon, M.

Identifier