Characterization of amorphous organic thin films, determination of precise model for spectroscopic ellipsometry measurements

Amsterdam [u.a.] / Elsevier (2010) [Journal Article]

Applied surface science
Volume: 107
Issue: 22
Page(s): 6612-6617

Authors

Selected Authors

Farahzadi, Azadeh
Beigmohamadi, Maryam
Niyamakom, Phenwisa
Kremers, Stephan
Meyer, Nico

Other Authors

Heuken, Michael
Wuttig, Matthias

Identifier