Advanced characterization tools for thin films in low-E systems

Amsterdam [u.a.] / Elsevier (1999) [Journal Article]

Thin solid films
Volume: 351
Page(s): 184-184

Authors

Selected Authors

Weis, H.
Müggenburg, T.
Friedrich, I.
Grosse, P.
Herlitze, L.

Other Authors

Wuttig, M.

Identifier

  • REPORT NUMBER: RWTH-CONV-042079