Grazing incidence diffuse X-ray scattering investigation of the properties of irradiation-induced point defects in silicon

Ridge, NY / APS (2001) [Journal Article]

Physical review / B, Condensed matter and materials physics
Volume: 64
Issue: 23
Page(s): 235207

Authors

Selected Authors

Partyka, P. J.
Zhong, Y.
Nordlund, K.
Averback, R. S.
Robinson, I. M.

Other Authors

Ehrhart, Peter

Identifier