Comparison between gallium-implanted layers of ZnSe and ZnSSe by optical, electrical and electron beam characterization methods

(1993) [Contribution to a conference proceedings]

Proc. 2.-6. Int. Conf. 1993

Authors

Selected Authors

Gleitsmann, G.
Ammann, Norbert
Hermans, J.
Schneider, A.
Geurts, J.

Other Authors

Karduck, P.
Heuken, M.

Identifier

  • REPORT NUMBER: RWTH-CONV-192788