Characterization of porous silicon layers by reflectance spectroscopy

(1993) [Contribution to a conference proceedings]

Proc. Mat. Res. Soc. Sympos. 238 (1993)
Page(s): 215

Authors

Selected Authors

Theiss, W.
Grosse, P.
Münder, H.
Lüth, H.
Herino, R.

Other Authors

Ligeon, M.

Identifier

  • REPORT NUMBER: RWTH-CONV-192784