application oriented nano-optics

   doped nanowire showing fluctuations in the charge carrier density Copyright: RWTH Aachen doped nanowire showing fluctuations in the charge carrier density

Material Characterization

Near-field spectroscopy enables the determination of their local charge carrier density and mobility. The quantitative analysis of the measurements requires detailed modeling of the near-field interaction between tip and sample. In combination with other high-resolution methods, such as atomic force microscopy (AFM), electron microscopy and conductive AFM this allows answering fundamental questions about the growth, domain forming and other structural properties