• S. Stille, Ch. Lenser, R. Dittmann, A. Koehl, I. Krug, R. Muenstermann, J. Perlich, C.M. Schneider, U. Klemradt, R. Waser
  Detection of filament formation in forming-free resistive switching SrTiO₃ devices with Ti top electrodes
  Applied Physics Letters, im Druck
• Synchrotron X-ray Beamlines
  Buchbeitrag zur 43^rd IFF Spring School (Forschungszentrum Jülich) (Manuscript)
• T. Rieger, K. Herrmann, D. Carmele, S. Meyer, T. Lippmann, A. Stark, W. Bleck, U. Klemradt
  Quenching and Partitioning - An In Situ Approach to Characterize the Process Kinetics and the Final Microstructure of TRIP-Assisted Steel
  Advanced Materials Research 409, 713 (2012)
• D. Carmele, T. Rieger, K. Herrmann, S. Meyer, T. Lippmann, A. Stark, W. Bleck, U. Klemradt
  Very Hard Synchrotron X-Ray Radiation as an Advanced Characterization Method Applied to Advanced High-Strenght Steels
  Advanced Materials Research 409, 660 (2012)

• L. Müller, M. Waldorf, C. Gutt, G. Grübel, A. Madsen, T.R. Finlayson, U. Klemradt 
  Slow ageing dynamics and avalanches in a Gold-Cadmium alloy investigated by x-ray photon correlation spectroscopy
  Phys. Rev. Lett. 107, 105701 (2011)
• J.-L. Cao, K. Zhang, A. Solbach, Z.X. Yue, H.H. Wang, Y. Chen, U. Klemradt
  In situ x-ray reflectivity study of imprint in ferroelectric thin films
  Materials Science Forum 687, 292 (2011)

• J.-L. Cao, Y.-B. Ren, L. Peng, L. Qiao, H.-W. Gu, T. Li, Z. Yue, U. Klemradt
  Evidences for interfacial phase decomposition in ferroelectric thin films during fatigue
  Electrochemical and Solid-State Lett. 13, G102-104 (2010)

• W. Michaeli, U. Klemradt, A. Elas, D. Carmele
  Evaluation of Dispersion Characteristics of Polymer-Clay Nanocomposites by X-Ray Diffraction Measurement and Microscopy
  Society of Plastic Engineers, Annual Technical Conference Proceedings, Chicago , USA (2009)
• W. Michaeli, U. Klemradt, A. Elas, D. Carmele
  Evaluating Dispersion in Nanocomposites
  Plastics Research Online, DOI: 10.1002/spepro.000050 (2009)
• W. Michaeli, U. Klemradt, A. Elas, D. Carmele
  Visualizing the Orientation of Layered Silicates
  Kunststoffe international 10, 25-27 (2009)
• W. Michaeli, U. Klemradt, A. Elas, D. Carmele
  Orientierung von Schichtsilikaten visualisieren
  Kunststoffe 10, 44-47 (2009)
• B . Ludwig , C. Strothkaemper, U. Klemradt, X. Moya, L. Mañosa, E. Vives, A. Planes
  An acoustic emission study of the effect of a magnetic field on the martensitic transition in Ni2MnGa
  Appl. Phys. Lett. 94, 121901 (2009)
• B. Ludwig, C. Strothkaemper, U. Klemradt, X. Moya, L. Mañosa, E. Vives, A. Planes
  Premartensitic transition in Ni₂MnGa Heusler alloys: Acoustic emission study
  Phys. Rev. B 80, 144102 (2009)

• A. Petraru, H. Kohlstedt, U. Poppe, R. Waser, A. Solbach, U. Klemradt, J. Schubert, W. Zander, N. A. Pertsev
  Wedgelike ultrathin epitaxial BaTiO₃ films for studies of scaling effects in ferroelectrics
  Appl. Phys. Lett. 93, 072902 (2008)
• E. Bonnot, L. Mañosa, A. Planes, D. Soto-Parra, E. Vives, B. Ludwig, C. Strothkaemper, T. Fukuda, T. Kakeshita
  Acoustic emission in the fcc-fct martensitic transition of Fe_68.8Pd_31.2
  Phys. Rev. B 78, 184103 (2008)

• A. Petraru, N. A. Pertsev, H. Kohlstedt, U. Poppe, R. Waser, A. Solbach, U. Klemradt
  Polarization and lattice strains in epitaxial BaTiO₃ films grown by high-pressure sputtering
  J. Appl. Phys. 101, 114106 (2007)
• J.-L. Cao, A. Solbach, U. Klemradt, T. Weirich, J. Mayer, P. J. Schorn, U. Böttger
  Probing fatigue in ferroelectric thin films with subnanometer depth resolution
  Appl. Phys. Lett. 91, 072905 (2007)
• G. Landmesser, U. Klemradt, R.L. Johnson, T.R. Finlayson
  Surface Enhancement of Soft-Mode Transformation in Ni2MnGa
  Appl. Phys. Lett. 90, 021907 (2007)
• J.-L. Cao, A. Solbach, Y. Fang, U. Boettger, P. J. Schorn, R. Waser, U. Klemradt
  Effects of Thermal Annealing on Lead Zirconate Titanate Thin Film Capacitors with Platinum Electrodes
  J. Electrochem. Soc. 154, G251 (2007)

• J.-L. Cao, A. Solbach, U. Klemradt, T. Weirich, J. Mayer, U. Böttger, U. Ellerkmann, P.J. Schorn, P. Gerber, R. Waser
  Effects of thermal annealing on the structure of ferroelectric thin Films
  J. Am. Ceram.Soc., 89 [4] 1321-1325 (2006)
• J.-L. Cao, A. Solbach, U. Klemradt, T. Weirich, J. Mayer, U. Böttger, P.J. Schorn und R. Waser
  Density inhomogeneity in ferroelectric thin films
  Appl. Phys. Lett., 89, 052901 (2006) 
• J.-L. Cao, A. Solbach, U. Klemradt, T. Weirich, J. Mayer, H. Horn-Solle, U. Böttger, P.J. Schorn, T. Schneller und R. Waser
  Structural investigations of Pt/TiO_x electrode stacks for ferroelectric thin film devices
  J. Appl. Phys., 99, 114107 (2006) 
• L. Müller, U. Klemradt und T.R. Finlayson
  Time-dependent phenomena in athermal martensitic transformations
  Mat. Sci. Eng. A438-440, 122-125 (2006) 

• J.-L. Cao, A. Solbach, U. Klemradt
  X-ray reflectivity studies of ferroelectric and dielectric multilayer structures
  Physica B: Condensed Matter 357 (1-2): 122-125 (2005)

• J.D. Smith, T.R. Finlayson, C. Kirchner, U. Klemradt, M. Seitz, J.P. Sutter
  An application of synchrotron radiation to study the microstructure of passivation layers on GaAs
  Materials Forum 27, 21-27 (2004)

Buchbeiträge:

• M. Aspelmeyer, U. Klemradt
  Ferroelektrische Phasenumwandlungen
  in: Effekte der Physik und ihre Anwendungen,
  Hrsg. M. von Ardenne, G. Musiol, U. Klemradt (Verlag Harri Deutsch, Frankfurt, 3. Auflage 2004, im Druck)
• U. Klemradt
  Martensitische Phasenumwandlungen
  in: Effekte der Physik und ihre Anwendungen,
  Hrsg. M. von Ardenne, G. Musiol, U. Klemradt (Verlag Harri Deutsch, Frankfurt, 3. Auflage 2004, im Druck)

• K.E. Crompton, T.R. Finlayson, C. Kirchner, M. Seitz, U.Klemradt
  Microstructural study of a passivation layer on GaAs: an application of x-ray reflectivity under grazing angles using a synchrotron source
  Surface Rev. Lett. 10, 373-379 (2003)
• G. Landmesser, T.R. Finlayson, R.L. Johnson, M. Aspelmeyer, A. Plech, J. Peisl, U. Klemradt
  Phonon anomalies in displacive phase transitions by surface x-ray scattering
  J. Phys. IV 112 123-127 (2003)
• M. Aspelmeyer, U. Klemradt, L.T. Wood, S.C. Moss
  Growth kinetics of an athermal martensitic transformation by time-resolved optical diffraction from a Ni₆₃Al₃₇ (001) surface
  J. Phys. IV 112, 151-157 (2003)

• U. Klemradt, M. Aspelmeyer, L.T. Wood, S.C. Moss
  An experimental method to investigate the structure and kinetics of patterned surfaces using laser light diffraction
  Rev. Sci. Instr. 73, 108-113 (2002)
• A. Plech, U. Klemradt, M. Aspelmeyer, M. Huber, J. Peisl
  Solid-liquid interface of a 2-propanolperfluoromethylcyclohexane mixture: from adsorption to wetting
  Phy. Rev. E 65, 061604 / 1-8 (2002)

• M. Aspelmeyer, U. Klemradt, W. Hartner, H. Bachhofer, G. Schindler
  High-resolution x-ray reflectivity study of thin layered electrodes for integrated ferroelectric devices
  Journal of Physics D: Applied Physics 34, A173-A178 (2001)
• A. Plech, U. Klemradt, J. Peisl
  Wetting transition and pretransitional thin films in a binary liquid mixture
  J. Phys.: Condens. Matter 13, 5563-5576 (2001)

• A. Plech, U. Klemradt, M. Huber, J. Peisl
  Wetting transition of a binary liquid mixture at a solid boundary
  Europhysics Letters 49, 583-589 (2000)
• U. Klemradt, M. Aspelmeyer, H. Abe, L.T. Wood, S.C. Moss, E. DiMasi, J. Peisl
  Premonitory martensitic surface relief via novel x-ray diffuse and laser light reflectivity from the (001) surface of a Ni₆₃Al₃₇ single crystal
  Mater. Res. Soc. Symp. Proc. 580, 293-302 (2000)

Buchbeitrag:

• U. Klemradt
  Phasenübergänge und kritische Phänomene
  Essay-Beitrag für das Lexikon der Physik, Band 4, S. 246-251
  (Spektrum Akademischer Verlag, Heidelberg, 2000)

• P. Yang, U. Klemradt, Y. Tao, J. Peisl, R.W. Peng, A. Hu, S.S. Jiang
  Long-term stability of a quasiperiodic Ta/Al multilayer: disintegration at room temperature analyzed by grazing angle x-ray scattering and photoelectron spectroscopy
  J. Appl. Phys. 86, 267-274 (1999)
• M. Fromm, U. Klemradt, G. Landmesser, J. Peisl
  Grazing incidence x-ray reflectivity: a new experimental approach to the martensitic surface relief
  Mat. Sci. Eng. A 273-275, 291-295 (1999)
• M. Aspelmeyer, U. Klemradt, H. Abe, S.C. Moss, J. Peisl
  Martensitic relief formation on an electropolished Ni63Al37 (001) surface by diffuse x-ray scattering under grazing angles
  Mat. Sci. Eng. A 273-275, 286-290 (1999)
• M. Aspelmeyer, U. Klemradt, L.T. Wood, S.C. Moss, J. Peisl
  Time-dependent aspects of the athermal martensitic transformation: first observation of incubation time in Ni-Al
  phys. stat. sol. (a) 174, R9-10 (1999)
• G. Landmesser, U. Klemradt, T.R. Finlayson, R.L. Johnson, J. Peisl
  Studies of displacive phase transformations in crystalline solids using grazing incidence x-ray techniques
  Jap. Inst. of Metals Proc. 12 (II), 973-976 (1999)

• A. Plech, U. Klemradt, H. Metzger, J. Peisl
  In situ x-ray reflectivity study of the oxidation kinetics of liquid gallium and the liquid alloy Ga0.93Hg0.07
  J. Phys.: Condens. Matter 10, 971-982 (1998)
• A. Ulyanenkov, U. Klemradt, U. Pietsch
  Investigation of strain relaxation in GaInAs/GaAs superlattices by x-ray diffuse scattering
  Physica B 248, 25-30 (1998)
• U. Klemradt, M. Fromm, G. Landmesser, H. Amschler, J. Peisl
  Surface effects in displacive phase transformations studied by x-ray specular reflectivity
  Physica B 248, 83-89 (1998)