For the research on the physical properties of novel materials, a wide range of experimental and theoretical methods is employed.

For sample preparation, numerous techniques are available:

• sputter deposition,
• thermal evaporation,
• electron-beam deposition and
• combinatoral evaporation.

The resulting stoichiometries can be checked by

• Rutherford-back scattering (RBS),
• secondary neutral mass spectroscopy (SNMS) and
  
• energy dispersive X-ray analysis (EDX).

The characterization of structures becomes feasible by the application of

• X-ray diffraction (XRD) and
• X-ray reflectometry (XRR).

Furthermore we have regular access to

• transmission electron microscopy (TEM),
• extended X-ray absorption fine structure (EXAFS),
• neutron scattering and
• X-ray diffraction at a synchroton.

In Combination with thermal analysis, namely

• differential scanning calorimetry (DSC),

these methods allow us to determine temperature-dependent the structure of the prepared materials.

On this basis a number of standard characterization tools can be employed to investigate mechanical, optical and electrical properties. For example

• Contact angle and
• ex-situ stress measurements.

Optical properties can be studied over a wide spectral range by

• fourier-transformation IR-spektroscopy (FTIR),
• IR-absorption and
• ellipsometry.

Furthermore, the temperature-dependence of electronic properties are measured using

• Hall-effect and
  
• Van-der-Pauw method.

In addition, some custom experimental setups are available, e.g. a static and a electric tester in the phase change group.

Besides the experimental branch also simulations are performed to gain a deeper understanding, such as

• finite elements method (FEM) and
• density functional theory calculations (DFT),

all of which have proven to greatly complement experimental work.

Through international colaborations with both scientific and industrial partners further methods can be exploited by the groups of the I.Institute of Physics (IA).